Pixel Calibration Chart QV/QS, 02AKN020

Description Combined non contact measurements with vision system and White Light Interferometer (WLI) Easy alignment and positioning with vision sensor Full QVPAK functionality with Vision system Enhanced functionality with WLI-system for high resolution topography evaluation such as surface roughness analysis *VAT excluded. All products are intended to be sold to commercial customers. Product illustrations are without obligation. Product descriptions, in particular any and all technical specifications, are only binding when explicitly agreed upon. ` Cataloge: